ZEISS Sigma

FE-SEM for High-Quality Imaging & Advanced Analytical Microscopy

ZEISS Sigma series

The ZEISS Sigma family combines field emission scanning electron microscope (FE-SEM) technology with an excellent user experience. Structure your imaging and analysis routines and increase productivity. Study new materials, particles for quality inspection or biological or geological specimens. Make no compromises in high resolution imaging – go to low voltages and benefit from enhanced resolution and contrast at 1 kV or below. Execute advanced analytical microscopy using best-in-class EDS geometry and get analytical data at twice the speed and with more precision.​

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EVO series

Modular SEM Platform for Intuitive Operation, Routine Investigations and Research Applications

ZEISS EVO Scanning electron microscope

The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience that appeals to both trained microscopists and new users. With its comprehensive range of available options, EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis.

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ZEISS GeminiSEM

FE-SEM For Highest Demands in Sub-nanometer Imaging, Analytics and Sample Flexibility

ZEISS GeminiSEM 360 / 460 / 560 series

ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. Innovations in electron optics and a new chamber design let you benefit from better image quality, usability and flexibility. Take sub-nanometer images below 1 kV without an immersion lens. Discover three unique designs of the ZEISS Gemini electron optics.

New standard for surface imaging – ZEISS GeminiSEM 560

Ideal for core facilities – ZEISS GeminiSEM 360

Enabling efficient analysis – ZEISS GeminiSEM 460

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